ThinkLaser SC300 300 mm Debris-Free Wafer Soft-Marking System

ThinkLaser SC300 automated 300 mm wafer laser marking system for debris-free soft marking, permanent

The ThinkLaser SC300 is an automated semiconductor wafer laser marking system developed for permanent identification and traceability marking on 300 mm silicon wafers.

Designed specifically for high-volume semiconductor manufacturing, the SC300 combines debris-free soft marking, automated wafer handling, optical alignment, production recipe management and factory communication in one integrated platform.

Unlike conventional hard-marking equipment that creates deeper marks on the wafer surface, the SC300 uses a controlled soft-marking process. This produces shallow, readable dot-matrix marks while minimizing particle generation and unnecessary surface disturbance.

The equipment is suitable for semiconductor fabs, silicon wafer manufacturers, foundries, wafer reclaim operations and other facilities requiring reliable 300 mm wafer identification in a controlled cleanroom environment.

ThinkLaser SC300 300 mm Debris-Free Wafer Soft-Marking System

Permanent Identification for 300 mm Semiconductor Wafers

Modern semiconductor wafers pass through multiple fabrication, inspection, cleaning, measurement and material-handling processes.

A permanent wafer identification mark allows each physical wafer to remain connected to its production lot, process history, quality records and manufacturing data.

The ThinkLaser SC300 can apply information such as:

  • Wafer identification numbers

  • Production lot numbers

  • Batch numbers

  • Serial numbers

  • Manufacturing codes

  • Process tracking information

  • Dot-matrix characters

  • Barcodes

  • Two-dimensional data matrix codes

  • Customer-specific wafer IDs

  • Factory traceability information

Because the identification is marked directly onto the wafer surface, it does not depend on labels, ink or other removable identification methods.

Debris-Free Wafer Soft Marking

The SC300 is designed around a low-debris soft-marking process for polished semiconductor wafers.

Soft marking creates shallow permanent marks while reducing particle generation compared with conventional deep laser engraving. This makes the equipment suitable for applications where cleanroom compatibility and wafer-surface control are important.

The soft-marking process helps support:

  • Permanent wafer identification

  • Reduced particle generation

  • Controlled wafer-surface modification

  • Consistent dot formation

  • Stable character readability

  • Automated wafer traceability

  • Cleanroom production requirements

  • High-volume semiconductor manufacturing

Marking performance depends on the wafer material, laser condition, optical configuration and selected production recipe.

SuperSoftMark Technology

The ThinkLaser SC300 uses SuperSoftMark technology to create controlled dot-matrix marks on polished silicon wafers.

The process combines a stable diode-pumped laser, precision focusing optics and system-level process control to maintain consistent marking results.

Representative marking depth is approximately 2.4 μm, with configurable process depth available according to the installed laser and recipe.

The SuperSoftMark process is designed to provide:

  • Shallow permanent marks

  • Low marking debris

  • Consistent dot depth

  • Controlled dot diameter

  • High character readability

  • Reduced wafer contamination risk

  • Repeatable production results

  • Stable marking across multiple wafer lots

The final process parameters should be qualified using the customer’s intended wafer material and downstream manufacturing process.

Dedicated 300 mm Wafer Processing

The SC300 is primarily designed for automated processing of 300 mm semiconductor wafers.

A representative system includes two 300 mm cassette ports, an optical wafer aligner and an automated pick-and-place robot with a single end effector.

Typical wafer-handling components may include:

  • Two 300 mm cassette-loading ports

  • Automated wafer-loading system

  • Pick-and-place wafer robot

  • Single robot end effector

  • High-resolution optical wafer aligner

  • Automatic wafer positioning

  • Automated laser-marking sequence

  • Automatic wafer unloading

Some system configurations may include an optional 200 mm bridge capability. The actual installed wafer-size hardware should be verified before purchasing an available machine.

Optional 200 mm Wafer Bridge Capability

Although the SC300 is primarily configured for 300 mm wafers, selected machines may include optional hardware for processing 200 mm wafers.

The availability of 200 mm capability depends on the system configuration and may require:

  • Wafer-size bridge hardware

  • Compatible cassette adapters

  • Robot end-effector changes

  • Wafer-aligner configuration

  • Software recipe support

  • Wafer-handling qualification

The model name alone does not confirm that a machine can process both 200 mm and 300 mm wafers.

Buyers should inspect the actual installed hardware, accessories and software before purchase.

Polished Silicon Wafer Compatibility

The standard SC300 application is soft marking on polished, non-coated, pure silicon wafers.

Representative compatible materials include:

  • Polished silicon wafers

  • Prime silicon wafers

  • Monitor wafers

  • Test wafers

  • Process-development wafers

  • Selected reclaimed silicon wafers

Compatibility with coated wafers, patterned wafers or specialty semiconductor substrates should be evaluated separately.

Application testing is recommended before processing:

  • Silicon carbide wafers

  • Gallium arsenide wafers

  • Glass substrates

  • Sapphire wafers

  • Coated silicon wafers

  • Transparent semiconductor materials

  • Compound-semiconductor wafers

Mark quality may vary according to the substrate material, surface finish, coating, laser absorption and required mark depth.

SEMI-Compatible Wafer Marking

The SC300 is designed to support wafer identification formats used in semiconductor manufacturing.

Representative compatibility includes SEMI T7, M12 and M13 marking requirements.

Standard marking formats may include:

  • 5 × 9 SEMI single-density dot matrix

  • 9 × 17 single-density dot matrix

  • 10 × 18 double-density dot matrix

  • T1 BC-412 barcode

  • T7 two-dimensional data matrix

  • M12 character formation

  • M13 character formation

  • User-selectable checksum

  • Custom marking fonts

Depending on the selected character format and layout, the system may support up to 80 characters in one marking group.

The required marking format should be confirmed against the software version installed on the available equipment.

Straight-Line and Arc Marking

The ThinkLaser SC300 can produce dot-matrix marks in straight-line or arc-shaped layouts.

Straight-line marking can be used for conventional character strings, wafer IDs and production codes.

Arc marking allows the identification content to follow the curved circumference of the wafer.

Available layout options may include:

  • Straight wafer ID marking

  • Arc-shaped wafer-edge marking

  • Multiple marking groups

  • Different character orientations

  • Primary and secondary identification groups

  • Customer-defined marking positions

  • Machine-readable code placement

Multiple marking groups can be positioned at different orientations within a defined area around the wafer circumference.

Controlled Marking Location

The SC300 can place identification marks within a band around the wafer circumference.

Representative marking location is within approximately 25 mm of the wafer edge.

This allows production engineers to control the relationship between the identification mark and active wafer areas.

Marking-position control helps support:

  • Consistent wafer ID placement

  • Reduced interference with device areas

  • Repeatability between wafers

  • Compatibility with wafer-edge inspection

  • Standardized factory marking layouts

  • Multiple identification groups

  • Accurate arc-mark positioning

The final marking location should be selected according to the wafer design and production requirements.

Optical Wafer Alignment

Accurate marking requires the wafer position and orientation to be identified before the laser process begins.

The SC300 uses a high-resolution optical wafer aligner to establish the wafer reference and control mark placement.

Optical alignment can help manage:

  • Wafer orientation

  • Notch position

  • Marking angle

  • Distance from the wafer edge

  • Straight-line mark position

  • Arc-mark position

  • Placement of multiple marking groups

  • Repeatability across production batches

Representative mark-position repeatability is approximately ±75 μm in the X and Y directions relative to the primary wafer reference.

Actual positioning performance depends on the aligner condition, robot calibration, wafer condition and system maintenance.

Controlled Dot Diameter and Depth

Consistent dot dimensions are important for readable and repeatable wafer identification.

Representative SC300 marking specifications include:

  • Dot diameter of approximately 50–70 μm

  • Dot-diameter tolerance of approximately ±10%

  • Dot depth of approximately 2.4 μm

  • Configurable process depth up to approximately 5 μm

  • Dot-roundness ratio below approximately 1.1

Available laser spot sizes may include:

  • 50 μm

  • 60 μm

  • 70 μm

The installed optical configuration determines which spot sizes are available on an individual machine.

Stable Dot Formation

Each wafer ID character is formed from a group of controlled laser-generated dots.

Variations in dot size, depth or shape may reduce readability and affect automated character recognition.

The SC300 combines stable laser pulses, flat-field focusing optics and closed-loop control to help maintain:

  • Consistent dot diameter

  • Controlled dot depth

  • Uniform dot shape

  • Stable laser pulse energy

  • Repeatable character formation

  • Reliable mark contrast

  • Production-to-production consistency

  • Machine-readable identification quality

Actual results depend on the wafer surface, laser condition, optical alignment and production recipe.

High-Volume Automated Production

The ThinkLaser SC300 is designed for automated semiconductor production rather than manual wafer loading.

The cassette ports, wafer robot, optical aligner and laser system operate as a coordinated production platform.

Representative throughput is approximately 125 to 180 wafers per hour under specified conditions using:

  • Single-pulse marking

  • A 5 × 9 dot-matrix format

  • A 12-character identification mark

Machines equipped with optional edge-handling functions may have representative throughput of approximately 70 to 110 wafers per hour under similar marking conditions.

Actual throughput depends on:

  • Marking character quantity

  • Selected font

  • Marking depth

  • Number of marking groups

  • Wafer-alignment time

  • Robot movement

  • Cassette-loading sequence

  • Host communication

  • Edge-handling requirements

  • Equipment condition

Production capacity should be evaluated using the intended wafer recipe.

Automated Wafer Transport

The SC300 uses an automated pick-and-place robot to transport wafers between the cassette ports, aligner and laser-marking position.

Automated wafer transport helps reduce manual handling and supports repeatable wafer positioning.

A representative wafer-handling sequence may include:

  1. Wafer selection from the cassette

  2. Automated wafer pickup

  3. Transfer to the optical aligner

  4. Wafer orientation and reference detection

  5. Transfer to the laser-marking position

  6. Execution of the selected marking recipe

  7. Return of the marked wafer to the cassette

The robot, end effector and aligner should be inspected when evaluating a used SC300 system.

Closed-Loop Laser Control

The SC300 combines its laser source with system-level closed-loop control.

This allows the equipment to monitor laser operation and maintain consistent marking performance during production.

Closed-loop control may help manage:

  • Laser pulse stability

  • Marking-energy consistency

  • Dot-depth control

  • Dot-diameter stability

  • Production recipe repeatability

  • Process variation

  • Laser-performance tracking

  • Preventive maintenance planning

Representative laser pulse stability is below approximately 0.5% at 1 kHz.

The actual performance of an available machine should be verified through inspection and marking tests.

Automated Process Data Logging

The SC300 can record laser and system-performance information to support production monitoring and statistical process control.

Available data-management functions may include:

  • Laser-performance records

  • Marking job history

  • Process recipe storage

  • Production quantity records

  • Fault and alarm logs

  • Equipment diagnostic information

  • Marking-quality data

  • System-status monitoring

Automated data logging helps manufacturing teams investigate process variation and maintain traceable production records.

Production Recipe Management

Different wafer products may require different identification formats, marking positions and process settings.

The SC300 allows operators to create and store multiple job files.

A marking recipe may contain:

  • Wafer size

  • Identification content

  • Dot-matrix format

  • Character quantity

  • Marking position

  • Marking orientation

  • Laser spot size

  • Marking depth

  • Cassette assignment

  • Production quantity

  • Host communication settings

Stored recipes help operators repeat qualified marking processes across multiple wafer lots.

SECS II/GEM Factory Integration

The ThinkLaser SC300 can include a SECS II/GEM communication interface for integration with semiconductor factory systems.

A compatible factory host or manufacturing execution system may use this interface for:

  • Equipment-status monitoring

  • Production job transfer

  • Remote recipe selection

  • Processing commands

  • Alarm reporting

  • Event monitoring

  • Production-data collection

  • Wafer tracking

  • Host-controlled operation

  • Factory automation management

The installed communication hardware, software version and licensing status should be verified before purchasing an available machine.

Laser and Optical System

Representative SC300 systems use an acousto-optic Q-switched, diode-pumped Nd:YLF laser.

Typical laser and optical characteristics include:

  • Diode-pumped laser source

  • Q-switched pulse generation

  • TEM00 beam mode

  • Approximately 1053 nm wavelength

  • Flat-field focusing lens

  • Stable pulse-to-pulse performance

  • Configurable laser spot sizes

  • Closed-loop process control

  • Programmable soft-marking parameters

Before purchasing a used SC300, buyers should verify:

  • Laser model

  • Laser serial number

  • Laser operating hours

  • Laser-output condition

  • Pulse stability

  • Beam quality

  • Optical-lens condition

  • Spot-size configuration

  • Laser cooling condition

  • Controller compatibility

  • Marking test results

Cleanroom-Compatible Equipment Design

The SC300 is designed for semiconductor cleanroom installation.

A representative system uses a stainless steel enclosure compatible with an ISO Class 5 cleanroom and an ISO Class 2 mini-environment around the controlled wafer-processing area.

Cleanroom-oriented design features may include:

  • Stainless steel equipment enclosure

  • Enclosed laser-marking area

  • Controlled wafer-handling environment

  • Mark-point exhaust connection

  • Process vacuum connection

  • Static-charge control

  • Automated wafer transfer

  • Reduced manual wafer contact

The suitability of an available machine should be evaluated according to its condition and the customer’s specific cleanroom standards.

Representative System Dimensions and Weight

Representative SC300 dimensions are:

  • Height: approximately 1981 mm

  • Width: approximately 1641 mm

  • Depth: approximately 1204 mm

Representative equipment weight may include:

  • Equipment front-end module: approximately 671 kg

  • Marking enclosure: approximately 519 kg

Actual dimensions and weight should be confirmed before planning transportation, cleanroom access and installation.

Representative Utility Requirements

Facility requirements may vary according to the exact equipment configuration.

Representative requirements include:

  • Electrical supply: 200–240 VAC

  • Phase: Single phase

  • Frequency: 50/60 Hz

  • Rated current: Approximately 23 FLA

  • Process vacuum: Required

  • Mark-point exhaust: Required

  • Maximum mark-point exhaust flow: Approximately 20 CFM

  • Exhaust-port diameter: Approximately 50.8 mm

  • Operating temperature: Approximately 12.8–27°C

  • Network connection: Required for host communication

All facility requirements should be confirmed from the equipment documentation before installation.

Main Equipment Features

  • Dedicated 300 mm semiconductor wafer marking

  • Optional 200 mm bridge capability

  • Debris-free soft-marking process

  • SuperSoftMark technology

  • Permanent wafer identification

  • Polished silicon wafer processing

  • Straight-line marking

  • Arc-shaped marking

  • Multiple marking-group placement

  • SEMI-compatible character formats

  • Dot-matrix marking

  • Barcode marking

  • Two-dimensional data matrix marking

  • Controlled dot diameter

  • Shallow marking depth

  • Optical wafer alignment

  • Automated wafer loading and unloading

  • Two 300 mm cassette ports

  • Pick-and-place wafer robot

  • Closed-loop laser control

  • Automated process data logging

  • Multiple job-file storage

  • Fault and error logging

  • SECS II/GEM factory communication

  • Cleanroom-compatible construction

  • High-volume production capability

Representative Technical Specifications

The following information is representative only. The actual available equipment should be inspected and verified before purchase.

  • Marking method: Dot-matrix laser soft marking

  • Marking layouts: Straight line and arc

  • Primary wafer size: 300 mm

  • Optional wafer capability: 200 mm bridge

  • Wafer material: Polished, non-coated, pure silicon

  • Dot diameter: Approximately 50–70 μm

  • Dot-depth reference: Approximately 2.4 μm

  • Configurable process depth: Approximately 2.4–5 μm

  • Dot roundness: Below approximately 1.1 major-to-minor axis ratio

  • Maximum characters: Up to 80 characters per group

  • Marking field: Approximately 50 × 50 mm after alignment

  • Mark location: Within a 25 mm band around the wafer circumference

  • Mark repeatability: Approximately ±75 μm in X and Y

  • Wafer alignment: High-resolution optical aligner

  • Wafer transport: Pick-and-place robot with single end effector

  • Cassette ports: Two 300 mm ports

  • Laser type: Q-switched, diode-pumped Nd:YLF

  • Laser wavelength: Approximately 1053 nm

  • Spot sizes: Approximately 50, 60 or 70 μm

  • Standard throughput: Approximately 125–180 wafers per hour

  • Optional edge-handling throughput: Approximately 70–110 wafers per hour

  • Factory communication: SECS II/GEM

  • Certification configuration: CE and applicable SEMI requirements

Equipment Configuration to Confirm

SC300 systems may have different hardware and software configurations according to manufacturing year and original production application.

Before purchasing, buyers should confirm:

  • Equipment manufacturing year

  • Machine serial number

  • Current operational condition

  • Laser model

  • Laser operating hours

  • Laser-output condition

  • Supported wafer size

  • Optional 200 mm bridge hardware

  • Cassette-port condition

  • Cassette compatibility

  • Robot condition

  • End-effector condition

  • Optical-aligner condition

  • Wafer-notch compatibility

  • Available laser spot sizes

  • Marking-depth capability

  • Supported marking fonts

  • Barcode capability

  • Data matrix capability

  • Computer configuration

  • Operating-system version

  • Control-software version

  • Recipe availability

  • SECS II/GEM availability

  • Factory-interface license

  • Data-logging capability

  • Process vacuum condition

  • Exhaust requirements

  • Maintenance history

  • Included documentation

  • Included accessories

  • Included spare parts

  • Current installation status

  • Deinstallation scope

  • Packing and transportation requirements

The model name alone does not confirm the complete configuration of an individual machine.

Typical Applications

The ThinkLaser SC300 can be used in semiconductor manufacturing environments requiring permanent identification of 300 mm wafers.

Semiconductor Fab Wafer Traceability

Semiconductor fabs can use permanent wafer IDs to connect physical wafers with production recipes, inspection results, equipment records and manufacturing history.

Silicon Wafer Manufacturing

Silicon wafer manufacturers can apply identification codes before wafers are supplied to downstream semiconductor fabrication facilities.

High-Volume 300 mm Wafer Production

The automated cassette ports, wafer robot and optical aligner allow the system to support repeated production marking with limited operator handling.

Wafer Lot and Batch Management

Lot numbers, serial numbers and production codes can be marked directly on each wafer to improve material tracking.

Cleanroom Wafer Identification

The shallow, low-debris marking process is suitable for controlled manufacturing environments where particle generation must be minimized.

Wafer Reclaim Operations

Compatible reclaimed silicon wafers can be permanently identified for incoming inspection, processing and outgoing batch management.

Research and Process Qualification

Semiconductor laboratories and process-development facilities can use the SC300 to identify test wafers, engineering samples and qualification lots.

Why Choose the ThinkLaser SC300?

The ThinkLaser SC300 is designed specifically for automated soft marking of 300 mm semiconductor wafers.

Its combination of low-debris marking, optical alignment, automated wafer transport, closed-loop laser control and factory communication makes it suitable for production environments requiring reliable wafer identification.

Compared with a general-purpose laser marking machine, the SC300 provides wafer-specific handling, semiconductor marking formats and cleanroom-oriented construction.

The system is particularly suitable for facilities that require permanent wafer traceability while minimizing marking particles and maintaining controlled wafer handling.

Frequently Asked Questions

What is the ThinkLaser SC300 used for?

The SC300 is used to apply permanent, low-debris identification marks to 300 mm semiconductor wafers for production tracking and traceability.

Is the SC300 a hard-marking or soft-marking system?

The SC300 is primarily a soft-marking system. It creates shallow dot-matrix marks while minimizing marking debris.

Which wafer size does the SC300 process?

The standard system is designed for 300 mm wafers. Some machines may include optional 200 mm bridge capability.

Can every SC300 process 200 mm wafers?

No. The machine must have the required bridge hardware, cassette adapters, robot configuration and software support.

Which wafer material is normally supported?

The standard application is polished, non-coated, pure silicon wafers.

What is the representative marking depth?

Representative dot depth is approximately 2.4 μm. The available process range may extend to approximately 5 μm depending on the machine configuration and recipe.

Can the SC300 create arc-shaped marks?

Yes. It supports both straight-line and arc-shaped dot-matrix marking.

Does the machine support automated wafer handling?

Yes. A representative configuration includes two 300 mm cassette ports, an optical aligner and an automated pick-and-place robot.

Does the SC300 support factory communication?

The system can include a SECS II/GEM interface for communication with compatible semiconductor factory host systems.

What should be checked before purchasing a used SC300?

Buyers should inspect the laser source, wafer robot, cassette ports, optical aligner, marking quality, software version, factory interface, utility requirements and maintenance history.

Request ThinkLaser SC300 Equipment Information

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Send us your required wafer size, marking format, wafer material, production application, preferred equipment condition and destination country.

We can provide available machine photos, equipment configuration, condition information, technical details and a quotation based on your project requirements.

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